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Wafer Sort TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experie...

Differential RF Scalar Correction for ATE Differential RF components usually require balun transformers to adapt to common ATE single-end instruments. Test parameters involving gain and particularly noise require that signal levels be precisely known at the DUT input and output. This paper outlines ...

The Problem Successful circuit design requires focused parametric measurements across a broad set of conditions. The practice of test generates huge quantities of data. And, financial priorities drive the order (rather disorder) of development. So, how can one retrieve focused and insightful informa...

Industry Partners TestEdge works with a wide range of companies to provide our customers with the best possible solutions, catered to their specific needs and challenges. Although we have preferred vendors and suppliers, based on a history of quality workmanship and technical capability, we are cont...