Home > Supplier Discovery > Company Profile
Website Snapshot of ANGSTROM SUN TECHNOLOGIES INC

ANGSTROM SUN TECHNOLOGIES INC

(978) 204-2317

33 Nagog Park,, Acton, Massachusetts   01720-3421 , USA

Visit Website Map & Directions

General Info:

angstrom sun technologies inc, a professional company that provides thin film thickness and optical constants measurement systems, including spectroscopic ellipsometer, reflectometer, microspectrophotometer, microreflectometer with ellipsometry or photometry

Products & Services:

  • Absorbtion Coefficients
  • Absorption Coefficient
  • Absorption Coefficients
  • Absorption Measurement
  • Advanced Thin Films
  • Coating
  • Coating Gage
  • Coating Gauge
  • Coating Gauges
  • Coating Inspection
  • Coating Inspection Equipment
  • Coating Inspector
  • Coating Measurement
  • Coating Measurements
  • Coating Thickness
  • Coating Thickness Gage
  • Coating Thickness Gages
  • Coating Thickness Gauge
  • Coating Thickness Gauges
  • Coating Thickness Guage
  • Coating Thickness Measurement
  • Coating Thickness Measurements
  • Coating Thickness Meter
  • Dielectric Constant Database
  • Dielectric Constants
  • Dielectrical Constants
  • Elipsometer
  • Ellipsometer
  • Ellipsometers
  • Ellipsometric
  • Ellipsometry
  • Ellipsometry Basics
  • Ellipsometry Measurement
  • Ellipsometry Software
  • Ellipsometry Thickness
  • Extinction Coefficient
  • Extinction Coefficients
  • Film Thickness
  • Film Thickness Conversion
  • Film Thickness Gage
  • Film Thickness Gauge
  • Film Thickness Gauges
  • Film Thickness Measurement
  • Film Thickness Measurements
  • Film Thickness Monitor
  • Film Thickness Monitoring
  • Handbook Of Ellipsometry
  • Handbook Of Optical Constants Of Solids
  • Imaging Ellipsometer
  • Imaging Ellipsometry
  • Index Of Refraction
  • Infrared Ellipsometry
  • Ir Ellipsometer
  • Ir Ellipsometry
  • Laser Ellipsometer
  • Laser Ellipsometry
  • Measure Coating
  • Measure Coating Thickness
  • Measure Film Thickness
  • Measure Paint Thickness
  • Measure Thickness
  • Measurement Optical
  • Measuring Coating Thickness
  • Metal Gauge Thickness
  • Metal Thickness
  • Microreflectometer
  • Microreflectometry
  • Microspectrometer
  • Microspectrophotometer
  • Optical Constant
  • Optical Constant Database
  • Optical Constants
  • Optical Instrument
  • Optical Measurements
  • Optical Profiler
  • Optical Properties
  • Optical Spectrum
  • Optical Thickness
  • Paint Thickness
  • Paint Thickness Gage
  • Paint Thickness Gauge
  • Paint Thickness Gauges
  • Paint Thickness Measurement
  • Paint Thickness Meter
  • Reflectometer
  • Reflectometry
  • Refractive Index
  • Refractive Index Database
  • Spectrometer Basics
  • Spectrometer Infrared
  • Spe

Web Site Results

(MOEMS) Device Spectroscopic Ellipsometry Study on E-beam Deposited Titanium Dioxide Films Home | Products | Analytical Service | Optical Constants Database | Ellipsometry... techniques Ellipsometry, Ellipsometer and Thin Films Atmospheric Stability of E-Beam Deposited Optical Thin Film Stacks Optical Properties of Hafnium Oxide Films Grown by Laser... Assisted Molecular Beam Deposition Properties of Titanium Oxide Thin Films Prepared with E-beam Evaporation Evaluation on Stress and Optical Properties of Thin Films Used in Optical MEMS...
to extract thickness, roughness and optical constants through proper optical model. At the same time, it is possible to further extract structure information from the relationship...Spectroscopic Ellipsometry Study on E-beam Deposited Titanium Dioxide Films Titanium oxide (TiO2) thin film has been widely used as optical coatings due to its high index... technique and conditions. In optical MEMS structure such as tunable vertical surface emission laser (VCSEL), TiO2 is preferred to be prepared with e-beam evaporation because...
Spectroscopic Ellipsometer for Coating and Film Thickness Measurement
component design and development Home | Products | Analytical Service | Optical Constants Database | Ellipsometry Database Publication List | Publication Abstracts | Presentations | Events...Angstrom Sun Technologies Inc - Find the Best Optical Solutions Home Products Analytical Service Databases Publications Events Support Careers Contact Us TFProbe 2.5 version... Film Stacks, Mapping Film Thickness and Optical Properties Combined SE and MSP with Digital Imaging Functions for Patterned Samples, DUV to IR Wavelength Range...

Website Links:

Company Profile:

Contact: 978-204-2317
Address: 33 Nagog Park,
Acton, Massachusetts   01720-3421 , USA
Url: http://www.angstec.com
Fax: 978-266-0108
   
Year Established: 2005
Ads by Openfos

Also Viewed