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SCIENTIFIC COMPUTING INTERNATIONAL

(760) 634-3822

6355 Corte Del Abeto, Carlsbad, California   92011-1443 , USA

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General Info:

Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis program, and FilmEllipse, an analysis and acquisition tool that can be used with any ellipsometer. (Ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, III-V compound semiconductor, optoelectroni

Products & Services:

  • Scientific Computing International
  • Sci
  • Film Thickness
  • Thin Film
  • Thin Film Thickness
  • Film Thickness Measurement
  • Metrology
  • Metrology Tools
  • Thin Film Metrology
  • Thin Film Metrology Tools
  • Ellipsometry
  • Ellipsometer
  • Ellipsometers
  • Spectroscopic Ellipsometry
  • Spectroscopic Ellipsometer
  • Se
  • Multiwavelength Ellipsometer
  • Reflectometry
  • Reflectometer
  • Reflectometers
  • Spectroscopic Reflectometry
  • Spectroscopic Reflectometer
  • Multi Angle Reflectometer
  • Material Characterization
  • Optical Properties
  • Sci
  • Scientific Computing International
  • Thickness
  • Index
  • Index Of Refraction
  • Extinction Coefficient
  • Material Analysis
  • Roughness
  • Crystallinity
  • Spectrophotometry
  • Spectrophotometer
  • Duv Spectroscopic Ellipsometer
  • Nir Spectroscopic Ellipsometer
  • Dispersion
  • Film Software
  • Optical Design
  • Low K
  • Porous Silicon
  • Polysilicon
  • Si
  • Transmission
  • Reflection
  • N And K
  • Optical Coatings
  • Optical Characterization
  • Optical Spectroscopy
  • Spectrograph
  • Spectrometers
  • Thin Film Software
  • Optical Design Software
  • Material Analysis Software
  • Ellipsometry Software
  • Optical Monitor Software
  • Optical Properties
  • Retardance
  • Birefringence

Web Site Results

Scientific Computing International - Raising Thin Film Metrology... Home | Customer Support | Download Center | Literature | Search... HomeCompanyMetrologyProductsSoftwareProductsApplicationsMeasurementServicesContactUs SCI provides high resolution thin-film metrology systems and analysis software products to leading companies in the semiconductor..., optoelectronics, data storage, display, MEMS, optical coating, biotechnology, and photovoltaic industries. SCI offers metrology systems for thin-film material characterization, with models...
An advanced metrology tool (FilmTek 3000) characterizes multilayer thin-film OLED structures based on power-spectral density analysis of spectroscopic multiangle polarized...
efficiency). Our FilmTek thin film metrology tools are being increasingly used in solar cell applications to characterize the various layers and interfaces during solar cell production. The... required for reducing the future costs of photovoltaic cells. FilmTek thin film metrology tools can be used for photovoltaic device characterization for all of the primary thin... photovoltaic device efficiency. The FilmTek 2000 thin film metrology tool readily measures these photovoltaic device parameters using non-contact reflection spectrophotometry. In addition...

Website Links:

Company Profile:

Contact: 760-634-3822
Address: 6355 Corte Del Abeto
Carlsbad, California   92011-1443 , USA
Url: http://www.sci-soft.com
Fax: 760-634-3826
   
Year Established: 1993
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