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Website Snapshot of NANO TECHNOLOGIES-AMERICA, INC.

NANO TECHNOLOGIES-AMERICA, INC.

(413) 693-0010

125 Paridon Street, Ste. 103, Springfield, Massachusetts   011182130 , USA

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Products & Services:

  • Scanning Probe
  • Spm
  • Atomic Force
  • Afm
  • Atomic Acoustical
  • Afam
  • Lateral Force
  • Phase Imaging
  • Force Modulation
  • Magnetic Force
  • Mfm
  • Electrostatic Force
  • Efm
  • Adhesion Force
  • Afm Lithography
  • Scanning Tunneling
  • Stm
  • Stm Lithography
  • Scanning Capacitance
  • Scm
  • Scanning Kelvin
  • Skm
  • Spreading Resistance
  • Youngs Modulus
  • Cantilevers

Web Site Results

mode Download Flash model In Contact mode of operation the cantilever deflection under scanning reflects repulsive force acting upon the tip. Repulsion force F acting upon the tip... is related to the cantilever deflection value x under Hooke's law: F = -kx, where k is cantilever spring constant. The spring constant value for different cantilevers usually vary... from 0.01 to several N/m. In our units the vertical cantilever deflection value is measured by means of the optical registration system and converted into electrical signal DFL. In...
Imaging mode Download Flash model Usage of Scanning Force Microscopy with oscillating cantilever was firstly anticipated by Binnig [1]. Earlier experimental realizations of scanning... with oscillated cantilever was realized in works [2,3]. It was demonstrated influence of the force gradients on the cantilever frequency shift and possibility of non-contact scanning... sample surface. It must be noted also that Durig studied frequency shift of oscillating cantilever under influence of STM tip [4]. In [2] was demonstrated also possibility...
Download Flash model In Contact mode of operation the cantilever deflection under scanning reflects repulsive force acting upon the tip. Repulsion force F acting upon the tip... is related to the cantilever deflection value x under Hooke's law: F = -kx, where k is cantilever spring constant. The spring constant value for different cantilevers usually vary from... 0.01 to several N/m. In our units the vertical cantilever deflection value is measured by means of the optical registration system and converted into electrical signal DFL. In...
by the feedback circuit reaction time. This disadvantage can be overcame by the fact that under scanning new value of cantilever oscillation amplitude (and error signal) usually... is achieved faster than preset value of the cantilever oscillation amplitude can be reached by the feedback system. Time of the reaching new value of the oscillation amplitude... is determined by the oscillation period and Q-quality of the cantilever. The feedback error signal, emerging when scanning in the Semicontact mode, contains some additional information...
in the Constant Force mode perpendicularly to longitudinal axis of the cantilever, besides the cantilever's deflection in the normal direction, an additional torsion bending... of the cantilever occurs. It is caused by the moment of forces acting on the tip. With minor deflections, the angle of torsion is proportional to the side (lateral) force. The cantilever's...

Company Profile:

Contact: 413-693-0010
Address: 125 Paridon Street, Ste. 103
Springfield, Massachusetts   011182130 , USA
Url: http://www.nt-america.com
Fax: 413-693-0007
   
Year Established: 2003
Annual Sales: Below US$1 Million
Business Type: Manufacturer
Ownership: Woman owned
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