Latest Technology SYSTEMS FOR NON-ORGANIC MATERIALS Silicon Layers 3-D Structures Screened Paste ITO Glass Masks SILICON LAYERS Process Control and Inspection of Silicon Wafers..., Substrates, Passivation Layers, and Flat Panels The Mscan can be configured for high speed color inspection of devices. Color is extremely important and necessary to detect many types... to 200 nanometers. The system supports both reflected and transmitted illumination. Transmitted illumination is used for inspection of glass panels and filters. Beltronics patented...

Latest Technology SYSTEMS FOR NON-ORGANIC MATERIALS Silicon Layers 3-D Structures Screened Paste ITO Glass Masks LATEST TECHNOLOGY Description of Technology For Inspection of Etched... and Printed Organic Electronics Currently inspection systems use reflected light to illuminate a sample. This is done by shining a beam of light onto the surface..., with the reflected image recorded by a camera, as shown on the left in Figure 1a below. However sometimes upon inspection, while the image would suggest there is no conductor present, conductive...

Latest Technology SYSTEMS FOR NON-ORGANIC MATERIALS Silicon Layers 3-D Structures Screened Paste ITO Glass Masks SCREENED PASTE Process Control and Inspection of Screened Paste, ITO..., and Glass Masks The Mscan can be configured for high speed inspection of devices using transmitted and reflected illumination simultaneously. The flexible architecture... partial openin screened circuitFigure 24 Back to top ITO and GLASS MASKS Process Control and Inspection of ITO, And Glass Masks The Mscan can be configured for high speed inspection...

Latest Technology SYSTEMS FOR NON-ORGANIC MATERIALS Silicon Layers 3-D Structures Screened Paste ITO Glass Masks MICRO VIAS - CONTACT BUMPS & PADS Process Control and Inspection... are images of organic residue detected by the Mscan and missed by an inspection system that uses reflected light. Reflected light Image of 200 micron contact bumpsFigure 15a Mscan... detects organic residueon surface of bumpsFigure 15b Organic residue as thin as an incredible 410 angstroms has been detected by the Mscan. Essential to this inspection...

Technology SYSTEMS FOR NON-ORGANIC MATERIALS Silicon Layers 3-D Structures Screened Paste ITO Glass Masks SUBSTRATES Inspection of Organic Substrates The Mscan detects fatal defects... speck of metal, not seen by reflected light systems. Such system frequently mask out parts of the via during inspection to avoid confusion and false calls. The Mscan's superior... detection capability overcomes these limitations enabling inspection of the entire via. Reflected Light Imagedoes not show pinhole Figure 7a Mscan finds defect2 micron pinhole Figure...