optical instruments light-sectioning microscope M1108 light-sectioning microscope M1108 description The Gaertner MI108 Light-Sectioning Microscope has been designed as a result of the increasing demand for technical testing of surfaces. In addition to the requirements of dimensional tolerances, the ...

ellipsometers calibration standards Ellipsometry Standards are silicon wafers with a thermally grown silicon dioxide film which permit ellipsometers to be calibrated so they can operate in top condition. Each standard is certified by Gaertner for the ellipsometric parameters of DELTA and PSI with de...

optical instruments differential stress refractometer LDSR differential stress refractometer LDSR description The LDSR Refractometer is designed for the measurement of compression and tensional stresses in commercial float, plate, and sheet glass. Stress measurements made with this instrument are no...

what's new ellipsometer upgrades for Windows Older Gaertner ellipsometer models L116, L116A, and L116B with Hewlett Packard computers can be upgraded to computers with Windows software.Old WAFERSKAN models L115A, L115B and L115C with Hewlett-Packard computers can be upgraded to Windows computers usi...

company info | email@gaertnerscientific.com ellipsometers microscopes optical instruments The stokes waferskan ellipsometer model LSE-WS measures 49 sites on a 300mm wafer in less than 49 seconds. It uses advanced technology to give precise 2D/3D images of film thickness and index. click here for mo...