Home | Customer Support | Download Center | Literature | Search HomeCompanyMetrologyProductsSoftwareProductsApplicationsMeasurementServicesContactUs Measuring Monolayer Graphite with Reflectometry-Ellipsometry Graphene, the single layer of graphite, has been the focus of many researchers internation...

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Home | Customer Support | Download Center | Literature | Search HomeCompanyMetrologyProductsSoftwareProductsApplicationsMeasurementServicesContactUs Characterizing Amorphous Silicon and Polysilicon FilmTek Advantages Simultaneous measurement of a-Si thickness, oxide thickness, and a-Si crystallinit...

Home | Customer Support | Download Center | Literature | Search HomeCompanyMetrologyProductsSoftwareProductsApplicationsMeasurementServicesContactUs Characterizing Phase Change Materials: GeSbTe (Germanium-Antimony-Tellurium or GST) FilmTek Advantages Simultaneous measurement of GeSbTe thickness, i...