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Website Snapshot of MAXMILE TECHNOLOGIES, LLC

MAXMILE TECHNOLOGIES, LLC

(803) 996-0672

428 Buckthorne Drive,, Lexington, South Carolina   29072-0000 , USA

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General Info:

maxmile technologies, llc is a developer and manufacturer of nondestructive semiconductor test equipments which provide the new capability and better efficiency for semiconductor research and industry.

Products & Services:

  • El
  • Pl
  • C-v
  • Cv
  • C-v
  • I-v
  • Capacitance-voltage
  • Mercury Probe
  • Mercury-free Probe
  • Led
  • Maxmile
  • Maxmile
  • Plm
  • Nondestructive
  • Semiconductor Measurements
  • Solid State Measurements
  • Current-voltage
  • Gaas
  • Gallium Arsenide
  • Silicon
  • Si
  • Conductance Voltage
  • Mdc
  • Msi
  • Mos
  • Schottky
  • Metal Oxide Semiconductor
  • Dielectric Constant
  • Resistivity
  • Permitivity
  • Pn Junction
  • Mis
  • Mosfet
  • Hg Probe
  • Doping Profile
  • Characterization
  • Evaluation
  • Test Equipment
  • Sic
  • Gan
  • Diamond
  • Silicon Carbide
  • Gallium Nitride
  • Wafer Substrates
  • Epitaxy Semiconductor
  • Device
  • Polarized Light
  • Defects
  • Electrical
  • Electroluminescence
  • Photoluminescence

Web Site Results

in 4H-SiC Schottky Rectifiers Currently SiC-based PN and Schottky junctions are still suffering fundamental device problems which can be briefed as forward-voltage degradation... and Schottky barrier height (SBH) inhomogeneities respectively. SiC Schottky diodes with inhomogeneous barriers usually have excess reverse leakage current and excess forward current... inhomogeneities. MaxMile Technologies has recently demonstrated a method which can be used to control the Schottky barrier inhomogeneities in SiC material. The experimental results indicated...
Publications FAQ Journal Inhomogeneities in Ni/4H-SiC Schottky barriers: Localized Fermi-level pinning by defect states , Journal of Applied Physics, Vol.101, 2007: 114514... Structure in Silicon Carbide, Material Science and Engineering B, Vol. 129, 2006: 216-221. Investigation on Barrier Inhomogeneities in 4H-SiC Schottky Rectifiers, physica status solidi... (a), Vol.203, 2006: 643-650. Defect Driven Inhomogeneities in Ni/4H-SiC Schottky Barriers, Applied Physics Letters, Vol.87, 2005: 242106. Investigation on small growth pits in 4H...
nondestructive EL mapping systems for unprocessed LED epiwafers 2006/01/26: MaxMile Technologies demonstrated a method to control the barrier inhomogeneities in 4H-SiC Schottky Rectifiers...

Company Profile:

Contact: 803-996-0672
Address: 428 Buckthorne Drive,
Lexington, South Carolina   29072-0000 , USA
Url: http://www.maxmiletech.com
Fax: 803-996-3583
   
Year Established: 2004
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