including Thickness, Bow-Warp, TTV, Site & Global flatness, Type and Resistivity. Particles, Scratches and haze are normally measured on a system like a Tencor Surfscan 6420 pictured... counters need regular calibration using a traceable particle standard. At the most enhanced viewing levels, the surface of many films (like Silicon Nitride) can be rough or have other.... .Total Thickness Variation is an important measurement done on Prime wafers at final inspection. It is done on a flatness checking machine like the ADE system pictured above. TTV...

well for you. These are the wafers we choose to build thin film standards on. Description: Again, a true Prime wafer with a perfect or near perfect Epitaxial layer is a wafer... stripped of thin films and re-polished to remove all patterns and scratches. Todays reclaim vendors will sort your wafers for thickness and resistivity and in most cases reclaim...