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ANGSTROM SUN TECHNOLOGIES INC

(978) 204-2317

33 Nagog Park,, Acton, Massachusetts   01720-3421 , USA

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General Info:

angstrom sun technologies inc, a professional company that provides thin film thickness and optical constants measurement systems, including spectroscopic ellipsometer, reflectometer, microspectrophotometer, microreflectometer with ellipsometry or photometry

Products & Services:

  • Absorbtion Coefficients
  • Absorption Coefficient
  • Absorption Coefficients
  • Absorption Measurement
  • Advanced Thin Films
  • Coating
  • Coating Gage
  • Coating Gauge
  • Coating Gauges
  • Coating Inspection
  • Coating Inspection Equipment
  • Coating Inspector
  • Coating Measurement
  • Coating Measurements
  • Coating Thickness
  • Coating Thickness Gage
  • Coating Thickness Gages
  • Coating Thickness Gauge
  • Coating Thickness Gauges
  • Coating Thickness Guage
  • Coating Thickness Measurement
  • Coating Thickness Measurements
  • Coating Thickness Meter
  • Dielectric Constant Database
  • Dielectric Constants
  • Dielectrical Constants
  • Elipsometer
  • Ellipsometer
  • Ellipsometers
  • Ellipsometric
  • Ellipsometry
  • Ellipsometry Basics
  • Ellipsometry Measurement
  • Ellipsometry Software
  • Ellipsometry Thickness
  • Extinction Coefficient
  • Extinction Coefficients
  • Film Thickness
  • Film Thickness Conversion
  • Film Thickness Gage
  • Film Thickness Gauge
  • Film Thickness Gauges
  • Film Thickness Measurement
  • Film Thickness Measurements
  • Film Thickness Monitor
  • Film Thickness Monitoring
  • Handbook Of Ellipsometry
  • Handbook Of Optical Constants Of Solids
  • Imaging Ellipsometer
  • Imaging Ellipsometry
  • Index Of Refraction
  • Infrared Ellipsometry
  • Ir Ellipsometer
  • Ir Ellipsometry
  • Laser Ellipsometer
  • Laser Ellipsometry
  • Measure Coating
  • Measure Coating Thickness
  • Measure Film Thickness
  • Measure Paint Thickness
  • Measure Thickness
  • Measurement Optical
  • Measuring Coating Thickness
  • Metal Gauge Thickness
  • Metal Thickness
  • Microreflectometer
  • Microreflectometry
  • Microspectrometer
  • Microspectrophotometer
  • Optical Constant
  • Optical Constant Database
  • Optical Constants
  • Optical Instrument
  • Optical Measurements
  • Optical Profiler
  • Optical Properties
  • Optical Spectrum
  • Optical Thickness
  • Paint Thickness
  • Paint Thickness Gage
  • Paint Thickness Gauge
  • Paint Thickness Gauges
  • Paint Thickness Measurement
  • Paint Thickness Meter
  • Reflectometer
  • Reflectometry
  • Refractive Index
  • Refractive Index Database
  • Spectrometer Basics
  • Spectrometer Infrared
  • Spe

Web Site Results

are available upon request. Please click this link to make a request if you need more. Characterization of thin films and stack in MOEMS structure with ellipsometry and reflectometry...

Company Profile:

Contact: 978-204-2317
Address: 33 Nagog Park,
Acton, Massachusetts   01720-3421 , USA
Url: http://www.angstec.com
Fax: 978-266-0108
   
Year Established: 2005
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