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Website Snapshot of Scientific Computing International Inc.

SCIENTIFIC COMPUTING INTERNATIONAL INC.

, Encinitas, California   92024 , USA

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General Info:

scientific computing international (sci) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, mems, data storage, and optical coating industries. sci also provides software for optical thin film design and material analysis including filmwizard, an optical thin film design and material analysis program, and filmellipse, an analysis and acquisition tool that can be used with any ellipsometer. (ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, nir spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, iii-v compound semiconductor, optoelectroni

Products & Services:

  • Scientific Computing International
  • Sci
  • Film Thickness
  • Thin Film
  • Thin Film Thickness
  • Film Thickness Measurement
  • Metrology
  • Metrology Tools
  • Thin Film Metrology
  • Thin Film Metrology Tools
  • Ellipsometry
  • Ellipsometer
  • Ellipsometers
  • Spectroscopic Ellipsometry
  • Spectroscopic Ellipsometer
  • Se
  • Multiwavelength Ellipsometer
  • Reflectometry
  • Reflectometer
  • Reflectometers
  • Spectroscopic Reflectometry
  • Spectroscopic Reflectometer
  • Multi Angle Reflectometer
  • Material Characterization
  • Optical Properties
  • Sci
  • Scientific Computing International
  • Thickness
  • Index
  • Index Of Refraction
  • Extinction Coefficient
  • Material Analysis
  • Roughness
  • Crystallinity
  • Spectrophotometry
  • Spectrophotometer
  • Duv Spectroscopic Ellipsometer
  • Nir Spectroscopic Ellipsometer
  • Dispersion
  • Film Software
  • Optical Design
  • Low K
  • Porous Silicon
  • Polysilicon
  • Si
  • Transmission
  • Reflection
  • N And K
  • Optical Coatings
  • Optical Characterization
  • Optical Spectroscopy
  • Spectrograph
  • Spectrometers
  • Thin Film Software
  • Optical Design Software
  • Material Analysis Software
  • Ellipsometry Software
  • Optical Monitor Software
  • Optical Properties
  • Retardance
  • Birefringence

Web Site Results

materials. Transmission spectrophotometry is an ideal method for measuring absorption and provides better resolution of the film s extinction coefficient (k) compared... constants of thin absorbing films on transparent substrates. Analysis of reflection and transmission data gives accurate thickness values as well as the refractive index and extinction... coefficients as a function of wavelength. Using a general dispersion model to model the optical response reduces the number of fitted parameters required, eliminating multiple...
of refraction [ n(l) ] (both TE and TM components of index) Extinction (absorption) coefficients [ k(l) ] Anisotropy and birefringence (nx, ny, nz) Energy band gap [ Eg ] Surface...
of refraction [ n(l) ] (both TE and TM components of index) Extinction (absorption) coefficients [ k(l) ] Birefringence (l) Energy band gap [ Eg ] Surface roughness and damage Porosity...

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