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SOLAR METROLOGY, LLC

(631) 472-2400

101 Colin Dr Ste 5, Holbrook, New York   117414332 , USA

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System SMX-ISI Monitor Solar PV Thin Film Depositions In-Situ System SMX-ISI enables you to integrate XRF film measurement and process controls directly into your line at key insertion points. System ISI is capable of accommodating any substrate material, including flexible roll-fed substrates for w...
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SOLAR TECHNOLOGY STANDARDS AND MEASURES CHEMISTRY ENGINEERING & MANUFACTURING ENVIRONMENTAL RESEARCH SOLAR TECHNOLOGY National Renewable Energy Laboratory The primary U.S. laboratory for renewable energy and energy efficiency research and development. DOE Solar Energy Technologies Program U.S. D...
SMX-ILH_Remote Control Station & X-Ray Head
SYSTEM SMX-ILH Remote XRF Control Station and Measurement Head Composition and thickness analysis for solar PV metal thin film stacks. Designed for near-line and in-line measurements in atmosphere. Process control and yield management for flexible and rigid solar PV substrates. Perform cross-gradien...
welcome xtnd pic
Solar Metrology is a global leader in high-performance X-Ray Fluorescence (XRF) analysis systems. Solar Metrology XRF tools are specifically engineered for the demanding thin film measurement requirements of the Solar Electric and Power Storage industries. Our core focus is delivering production-rea...

Company Profile:

Contact: 631-472-2400
Address: 101 Colin Dr Ste 5
Holbrook, New York   117414332 , USA
Url: http://www.solarmetrology.com
Fax: 631-472-2424
   
Annual Sales: Below US$1 Million
Business Type: Manufacturer
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