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SCIENTIFIC COMPUTING INTERNATIONAL

(760) 634-3822

6355 Corte Del Abeto, Carlsbad, California   92011-1443 , USA

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General Info:

Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis program, and FilmEllipse, an analysis and acquisition tool that can be used with any ellipsometer. (Ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, III-V compound semiconductor, optoelectroni

Products & Services:

  • Scientific Computing International
  • Sci
  • Film Thickness
  • Thin Film
  • Thin Film Thickness
  • Film Thickness Measurement
  • Metrology
  • Metrology Tools
  • Thin Film Metrology
  • Thin Film Metrology Tools
  • Ellipsometry
  • Ellipsometer
  • Ellipsometers
  • Spectroscopic Ellipsometry
  • Spectroscopic Ellipsometer
  • Se
  • Multiwavelength Ellipsometer
  • Reflectometry
  • Reflectometer
  • Reflectometers
  • Spectroscopic Reflectometry
  • Spectroscopic Reflectometer
  • Multi Angle Reflectometer
  • Material Characterization
  • Optical Properties
  • Sci
  • Scientific Computing International
  • Thickness
  • Index
  • Index Of Refraction
  • Extinction Coefficient
  • Material Analysis
  • Roughness
  • Crystallinity
  • Spectrophotometry
  • Spectrophotometer
  • Duv Spectroscopic Ellipsometer
  • Nir Spectroscopic Ellipsometer
  • Dispersion
  • Film Software
  • Optical Design
  • Low K
  • Porous Silicon
  • Polysilicon
  • Si
  • Transmission
  • Reflection
  • N And K
  • Optical Coatings
  • Optical Characterization
  • Optical Spectroscopy
  • Spectrograph
  • Spectrometers
  • Thin Film Software
  • Optical Design Software
  • Material Analysis Software
  • Ellipsometry Software
  • Optical Monitor Software
  • Optical Properties
  • Retardance
  • Birefringence

Web Site Results

Characterizing SiGe FilmTek Advantages Simultaneous determination of SiGe thickness and germanium concentration. Fast, accurate, and repeatable measurement of thin and thick SiGe films. Si... passivation for Ge pMOSFETs: Impact of Si cap growth conditions Copyright Scientific Computing International 1993-2013. All rights reserved. Top ...
Characterizing Amorphous Silicon and Polysilicon FilmTek Advantages Simultaneous measurement of a-Si thickness, oxide thickness, and a-Si crystallinity. Advanced process control...
(nk spectra). a-Si Film with 40nm RMS Surface Roughness FilmTek Surface Roughness Correlation with Atomic Force Microscopy (AFM) Copyright Scientific Computing International 1993-2013. All rights reserved. Top ...
Thickness for MEMS Structures SEM FilmTekTM 2000M TSV Si thickness ( m) Etch Depth ( m) CD ( m) Si thickness ( m) Etch Depth ( m) CD ( m) 18.3 125 89 18.96 124.46 89.30 8.2 123 88 8.57...
semiconductor materials which are suitable for the light absorbing layer, but the primary commercial technologies for thin film devices are based on amorphous silicon (a-Si), cadmium... film solar cell technologies. Our current installed customer base includes the largest manufacturer of CdTe based solar cells and several a-Si based solar cell companies. Amorphous... Silicon (a-Si) Amorphous solids, like common glass, are materials in which the atoms are not arranged in any particular order. They do not form crystalline structures at all...

Website Links:

Company Profile:

Contact: 760-634-3822
Address: 6355 Corte Del Abeto
Carlsbad, California   92011-1443 , USA
Url: http://www.sci-soft.com
Fax: 760-634-3826
   
Year Established: 1993
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