aehr test systems is a leading producer of test and burn-in equipment. the company develops, manufactures and sells systems that are designed to reduce the cost of testing dynamic random access memories (drams) and other integrated circuits (ics), perform reliability screening (burn-in) of complex logic and memory ics, and enable ic manufacturers to perform test and burn-in of bare die. with more than 2,000 systems installed worldwide, aehr test has set the standards for the test and burn-in since 1977.

Aehr Test Systems Aehr Test Aehr Ats Diepak Max Mtx Wafers Wafer Burn-in Wafer Level Burn-in Wafer-level Burn-in Aehr Test Systems Burn-in Parallel Test Massively Parallel Test Tdbi Wlbi Test During Burn-in Burn-in Board Bib Bibs Parallel Test Board Gd Known-good Die Mbt Mtt Waferpak Fox Max4 Max3 Max2

Atx Atx2 Environmental Test Environmental Stress Halt Hast Memory Test Dram Test Microprocessor Test Logic Test Dsp Test Digital Signal Processor Test Laser Diode Burn-in Vcsel Burn-in Accelerated Life Test Bathtub Curve Arrhenius Arrhenius Equation Mbi Monitored Burn-in Soft Errors Alpha Particle Wafer Probe Full Wafer Probe Full Wafer Contact Burn-in Socket Kgd Socket Burn-in Carrier Bare Die Carrier Bare Die Burn-in

Contact:	510-623-9400 x287
Address:	400 Kato Ter, Fremont, California   94539-8332 , USA
Url:	http://www.aehr.com
Fax:	510-623-9686
Year Established:	1977